> ## Documentation Index
> Fetch the complete documentation index at: https://docs.embedd.it/llms.txt
> Use this file to discover all available pages before exploring further.

# Data analytics

The testing environment provides powerful data analysis capabilities to help you understand your device's behavior:

* Time-series Analysis
  * View and analyze data points over time through interactive charts
  * Create multiple custom charts to monitor different parameters simultaneously
  * Compare raw and processed values on the same graph
* Data Export and Logging
  * Download complete log files in CSV format for offline analysis
  * Select specific data points for targeted analysis
* Real-time Monitoring
  * View default values and live readings for each register field
  * Track performance across different testing environments

In the timeseries section, you can plot:

* Registers
* Command results
* Formula results

To generate a log file, select the data points you want to plot. You can create multiple charts by clicking "Add chart" below the original chart.